Bibliografia
Principal
- Essentials of Electronic Testing for digital, Memory and Mixed-signal VLSI Circuits: Michael L. Bushnell, Vishwani D. Agrawal 2000 Kluwer Academic Publishers
- Self-Checking and Fault Tolerant Digital Design: Parg K. Lla 2001 Morgan Kaufmann Publishers
- An Introduction to Reliability and Maintainability Engineering: C. E. Ebeling 1997 McGraw-Hill