Bibliografia
Principal
- The Basics of Crystallography and Diffraction:
C. Hammond
2001
IUCr, Oxford Science Publications
- Electron Microscopy and Analysis:
P. J. Goodhew and F. J. Humphreys
1988
Taylor & Francis, London
- Basic Principles of Spectroscopy:
Raymond Chang
1971
International Student Edition, McGraw-Hill Kogakusha, Ltd.
Secundária
- Practical Surface Analysis. Auger and X-Ray Photoelectron Spectroscopy:
M. Briggs and P.Seah
1990
John Wiley & Sons, New York
- Ressonância Magnética Nuclear. Fundamentos, Métodos e Aplicações:
V.M.S. Gil e C.F.G.C. Geraldes
1987
Fundação Calouste Gulbenkian, Lisboa