Spectroscopy
CQFMResponsible: Ana Maria Rego | Ana Maria Ferraria
Contacts
Ana Maria Rego
ext.: 3255/7
e-mail: amrego@tecnico.ulisboa.pt
Ana Maria Ferraria
ext.: 3258/7
e-mail: ana.ferraria@tecnico.ulisboa.pt
Access conditions
Contact the responsible
Location
Instituto Superior Técnico, Avenida Rovisco Pais 1, 1049-001 Lisboa, CQFM - Molecular Physic and Chemistry Centre, Interdisciplinary Complex, 5th floor
High Resolution Electron Energy Loss Spectroscopy (1)
ApplicationsSurface analysis technique to study the interaction of electrons with the surface (~1nm depth), which lose their energy exciting vibrational and electronic states and promoting ionizations Requires conducting or semi-conducting samples X-ray Photoelectron Spectroscopy (2)Kratos XSAM800 ApplicationsStudy the elemental chemical composition of the surfaces till 10 nm depth Any solid surface (even powder-like samples) can be analysed as long as the vapour tension of all its components can withstand UHV |
Equipment (1) and (2)
Ultra-high-vacuum (UHV ~10-9 mbar)
Sample size:
10 to 15 mm wide
Thickness from a few microns to 5 mm
Contacts
Carlos Baleizão
tel.: 218 419 206
e-mail: carlos.baleizao@tecnico.ulisboa.pt
Access conditions
Contact the responsible
SpectrofluorimeterHoriba Jobin Yvon Fluorolog 3-22 EquipmentThermostated Sample Holder Solid Sample Holder Dewar for phosphorescence measurements Solid State IR detector (800-1550nm) Flash Lamp Polarizers Applications Measurement of excitation and emission fluorescence and phosphorescence spectra (including anisotropy) and determination of lifetimes longer than 1 microsecond |
SpectrofluorimeterSpex Fluorolog F112A Equipment450 W lamp Double excitation and emission monochromators Glan-Thompson polarisers for automated steady-state fluorescence anisotropy measurements Thermostated sample holder with a Julabo F25 water bath circulation Bio-Logic SFM-20 mixing device for stopped-flow kinetics ApplicationsPerforms steady-state fluorescence measurements |
SpectrophotometerShimadzu UV-3101PC UV-vis-NIR EquipmentPolarizers Integrating sphere for measurement of opaque solid materials Thermostated liquid sample holder (-20 to 90 ºC) |
SpectrophotometerJasco V-660 UV-vis EquipmentProgrammable temperature control system (4 to 100ºC) fully integrated with the software |
Responsible: Luís Filipe Vieira Ferreira
Contacts
Luís Filipe Vieira Ferreira
tel.: 218 419 252
e-mail: luisferreira@ist.utl.pt
Access conditions
Contact the responsible
Diffuse Reflectance Laser Flash Photolysis and Transmission Laser Flash PhotolysisEquipmentNd-YAG laser (10 to 1200 mJ/P) with Xe (450 W) and W QTH (250 W) lamps Time resolved absorption spectra of excited states, with time resolution from ns to s ApplicationUseful to study photochemical processes resulting from the adsorption of probes in nanocavities |
Time-resolved FTIRVarian 7000 EquipmentNd-Yag laser at 10Hz |
SpectrographICCD Andor i-Star 720 EquipmentSpectral resolution from 200 to 1050 nm |
InGaAs detector |
Laser Induced Luminescence and Absolute ΦF’s |
SpectraLab
Responsible: Luís Santos
Contact
tel.: 218 419 937
e-mail: luis.santos@tecnico.ulisboa.pt
Access conditions
Contact the responsible
Variable Angle Spectroscopic Ellipsometer (VASE)
Horiba Jobin-Yvon UVISEL
Equipment
Wavelength range: NIR to Visible
Films thickness range: 1 to 1000 nm
This equipment was purchased under the
"Programa Nacional de Re-equipamento Científico da Fundação para a Ciência
e a Tecnologia (project REEQ/293/CTM/ 2005). The Ellipsometer Laboratory is an IST/CQE infrastructure aimed at research and
development in the area of materials engineering. The laboratory is open to all research centers, both from IST and other
Universities, public and private institutions as well as industry. The ellipsometer is capable of measuring both the thickness and refractive
index of films ~ 1- 1000 nm in thickness, throughout a continuous range of
wavelengths between ~ 260 – 1700 nm. This instrument is capable of measuring the index and thickness not only of
single layer films deposited on a suitable substrate, but also of multilayer
film structures (yielding the index and thickness of each layer, through
suitable modelling and fitting procedures), as well as bulk samples.
Applications
Measurements of the thickness and the refractive index of single layer films, multilayer film structures (index and thickness of each layer, through suitable modelling and fitting procedures) and bulk samples
Areas: Microelectronics and semiconductor industries; Biology and membrane studies; Photovoltaic applications, Optical coatings; Polymer film industries
Location
Instituto Superior Técnico, Avenida Rovisco Pais 1, 1049-001 Lisboa, Physics Building, floor -1, room 01-5.7
Metricon M-line spectrometer with optical loss measurement capability
This equipment was purchased under the Programa Nacional de Re-equipamento Científico da Fundação para a Ciência e a Tecnologia (project REEQ/293/CTM/ 2005). The M-Line equipment is an IST/CQE infrastructure aimed at research and development in the area of materials engineering. The Metricon M-Line spectrometer is a prim coupler (n < 1.9) instrument capable of measuring the thickness and the refractive index of dielectric and polymer films and bulk samples, using optical wave guiding techniques, at several wavelengths: 532, 633, 980 and 1550 nm |
Fourier transform infrared spectrometer (FTIR)
Thermo Electron Corporation Nicolet 5700
EquipmentWavelength range: Visible to FIR (250 000 to 50 cm-1) Specular, diffuse and ATR reflection This equipment was purchased under the
"Programa Nacional de Re-equipamento Científico da Fundação para a Ciência
e a Tecnologia (project REEQ/293/CTM/ 2005). ApplicationsPharmaceutical and Environmental studies Food analysis: additives, preservatives, colorants |
Conservation and restauration of heritage: paintings, sculptures, ceramics, fossils, ivories
Forensic science: paints, textiles, cosmetics
Physiological samples (bones and hairs) and Geological samples
Multilayer compounds: polymers, paintings, films
Location
Instituto Superior Técnico, Avenida Rovisco Pais 1, 1049-001 Lisboa, Physics Building, floor -1, room 01-5.7
Confocal Micro-RamanLabRAM HR 800 Evolution (200 nm – 1600 nm), with a
HeNe (633 nm) internal laser, and two external diode lasers (532 nm and 785 nm) Equipment Lasers: 532, 633 and 785 nm This is a confocal high resolution micro-Raman
spectrometer (800 mm focal length), with 3D mapping and autofocus capability
(motorized XYZ stage), equipped with two motorized gratings (600 and 1800
gr/mm) and a Peltier cooled (-70º) CCD detector (1024x256 pixels). The
equipment os eqquiped with an Olympus BXFM confocal microscope with 5x, 10x,
50x (LWD) and 100x visible objectives plus visible macro lens for liquids and
polarization accessories and the Labspec 6 software suite with Multivariate
Analysis Module and KnowItAll database licence. |
Applications
Life Sciences: Drug/cell interactions, disease diagnosis, bone structure
Pharmaceuticals and Cosmetics: Polymorphic forms, crystallinity, contaminant identification
Geology and Mineralogy: Gemstone and mineral identification, inclusions
Carbon Materials: Purity of carbon nanotubes (CNTs), diamond like carbon (DLC) coatings
Semiconductors: Characterisation of intrinsic stress/strain, purity, Contaminations
Food analysis: additives, preservatives, colorants
Conservation and restauration of heritage: paintings, sculptures, ceramics, fossils, ivories
Forensic science: paints, textiles, cosmetics
Multilayer compounds: polymers, paintings, films
Location
Instituto Superior Técnico, Avenida Rovisco Pais 1, 1049-001 Lisboa, Physics Building, floor -1, room 01-5.9