Microscopy

MicroLab - Electron Microscopy Laboratory


Responsible: Amélia Almeida

Contact: Amélia AlmeidaIsabel Nogueira

tel: 218417882

Access conditions

The Electron Microscopy Unit of Instituto Superior Técnico, available for service to all students, professors and researchers of IST, other universities, research institutes and private companies

The facility is available both as user-run for authorized independent users and as a service with technical assistance.

An the online booking system is available to independent authorized users.

Further Information

http://microlab.ist.utl.pt

Location

Instituto Superior Técnico, Avenida Rovisco Pais 1, 1049-001 Lisboa, Mechanical II building, room 1.40a

Applications

The electron microscopes allow for structural and chemical analysis of a wide range of materials and biological samples using secondary electrons and backscattered electrons, elemental analysis including EDS X-ray mapping, crystallographic and texture analysis by electron-backscattered diffraction, particle sizing and counting, image analysis and specialized sample preparation

In transmission electron microscopy bright-field and dark-field imaging, phase identification by electron diffraction, elemental analysis with EDS and specialized sample preparation can be done


Transmission Electron Microscope

Hitachi 8100

Equipment

200 kV analytical transmission electron microscope

LaB6 filament

Equipped with ThermoNoran model System Six energy dispersive X-ray spectrometer (EDS)

Light elements detector and digital image acquisition 



 


FEG-Scanning Electron Microscope

Analytical EOL 7001F

Equipment

Oxford model INCA 250 PREMIUM EBSD (electron backscatter diffraction)

Energy dispersive X-ray spectrometer (EDS)

Light elements detector attachments




Analytical Scanning Electron Microscope

Hitachi S2400 analytical SEM

Equipment

Bruker Quantax energy dispersive X-ray spectrometer (EDS)

Light elements detector




Dimpler

VCR D500i

Applications

Used for transmission electron microscopy thin foil preparation



Ion Mill

Linda IV7 Pro Ion Mill

Applications

Used for transmission electron microscopy thin foil preparation







Electroerosion unit

Technoorg-Linda

Applications

Used for transmission electron microscopy thin foil cutting



Sputter coater

Polaron Quorom Technologies

Equipment

Sputter coater and evaporator

Applications

Deposition of Au/Pd, Cr and C films





Optical and Binocular Microscopes

Olympus optical microscope | Nikon binocular microscope

Applications

Microstructure observation, image analysis.



Scanning Probe Microscopy

Responsible: Patrícia Carvalho


Contact

Pedro Nolasco

Tel.: 218 417 357

Access conditions

Contact the person above

Location

Instituto Superior Técnico, Avenida Rovisco Pais 1, 1049-001 Lisboa, South tower, floor -2, room 02.10a



Atomic Force Microscope

NanoSurf Easyscan 2

Equipment

Tip-scanning type

Controlled temperature liquid cell and electrochemical cell




Inverted optical microscope

Olympus IX5

Equipment

Inverted Epi and Diascopic Optical Microscope



Confocal/Multiphoton Fluorescence Microscopy

Responsible: Ermelinda Maçoas


Contact

Tel.: 218 419 206

e-mail: ermelinda.macoas@tecnico.ulisboa.pt

Access Conditions

Contact the responsible. Within collaborative research work

Further Information

http://cqfm.ist.utl.pt/Resources_list.html#Microscopy

http://cqfm.ist.utl.pt/Services.html

Location

Instituto Superior Técnico, Avenida Rovisco Pais, Lisboa, CQFM - Molecular Physic and Chemistry Centre, Interdisciplinary Complex, room 532A

Applications

Imaging (2D and 3D) with simultaneous detection of three different emission zones

Förster Resonant Energy Transfer imaging (FRET)

Fluorescence Recovery After Photobleaching (FRAP)

Fluorescence Loss in Photobleaching (FLIP)

Fluorescence Correlation Spectroscopy (FCS)

Fluorescence Lifetime Imaging (FLIM)



Multiphoton/Confocal Fluorescence Microscope

Leica TCS-SP5

Equipment

CW-Argon Lasers (458, 465, 488, 496 and 514 nm)

HeNe (633nm) Pulsed Lasers: Ti:Saphire (710-990 nm, 100 fs, 80 MHz)

Autocorrelator

Two APDs set for single molecule FCS

TCSPC module coupled to a DCC-100 PMT for FLIM



INESC

Responsible: João Pedro Conde


Contact

Tel.: 213 100 237

Fax: 213 145 843

e-mail: geral@inesc-mn.pt

Access Conditions

Contact the responsible. Within collaborative research work.



Scanning Electron Microscope

Hitachi S2500

Equipment

Standard low voltage (3-30 kV) scanning electron microscope

Tungsten hairpin type filament

Magnification: 20 - 100 000x

Resolution: 3.5 nm

Maximum beam current: 300 mA maximum

Location

Rua Alves Redol, Nº9, PDMS room



Optical Microscope (1)

Olympus CKX41

Equipment

Reflected light IC inspection microscope

Magnifications: 100x, 500x and 1000x

Dark field and Nomarsky DIC (Differential Interference Contrast) observation capabilities

Location

Rua Alves Redol, Nº9



Optical Microscope (2)

Leica DMLM

Location

Rua Alves Redol, Nº9