MicroLab - Electron Microscopy Laboratory

Responsible: Amélia Almeida

Contact: Amélia Almeida | Isabel Nogueira

tel: 218417882

Access conditions

The Electron Microscopy Unit of Instituto Superior Técnico, available for service to all students, professors and researchers of IST, other universities, research institutes and private companies

The facility is available both as user-run for authorized independent users and as a service with technical assistance.

An the online booking system is available to independent authorized users.

Further Information

http://microlab.ist.utl.pt

Location

Instituto Superior Técnico, Avenida Rovisco Pais 1, 1049-001 Lisboa, Mechanical II building, room 1.40a

Applications

The electron microscopes allow for structural and chemical analysis of a wide range of materials and biological samples using secondary electrons and backscattered electrons, elemental analysis including EDS X-ray mapping, crystallographic and texture analysis by electron-backscattered diffraction, particle sizing and counting, image analysis and specialized sample preparation

In transmission electron microscopy bright-field and dark-field imaging, phase identification by electron diffraction, elemental analysis with EDS and specialized sample preparation can be done

Transmission Electron Microscope Hitachi 8100 Equipment 200 kV analytical transmission electron microscope LaB6 filament Equipped with ThermoNoran model System Six energy dispersive X-ray spectrometer (EDS) Light elements detector and digital image acquisition

FEG-Scanning Electron Microscope Analytical EOL 7001F Equipment Oxford model INCA 250 PREMIUM EBSD (electron backscatter diffraction) Energy dispersive X-ray spectrometer (EDS) Light elements detector attachments

Analytical Scanning Electron Microscope Hitachi S2400 analytical SEM Equipment Bruker Quantax energy dispersive X-ray spectrometer (EDS) Light elements detector

Dimpler

VCR D500i

Applications

Used for transmission electron microscopy thin foil preparation

Ion Mill Linda IV7 Pro Ion Mill Applications Used for transmission electron microscopy thin foil preparation

Electroerosion unit

Technoorg-Linda

Applications

Used for transmission electron microscopy thin foil cutting

Sputter coater Polaron Quorom Technologies Equipment Sputter coater and evaporator Applications Deposition of Au/Pd, Cr and C films

Optical and Binocular Microscopes

Olympus optical microscope | Nikon binocular microscope

Applications

Microstructure observation, image analysis.

Scanning Probe Microscopy

Responsible: Patrícia Carvalho

Contact

Pedro Nolasco

Tel.: 218 417 357

Access conditions

Contact the person above

Location

Instituto Superior Técnico, Avenida Rovisco Pais 1, 1049-001 Lisboa, South tower, floor -2, room 02.10a

Atomic Force Microscope NanoSurf Easyscan 2 Equipment Tip-scanning type Controlled temperature liquid cell and electrochemical cell

Inverted optical microscope

Olympus IX5

Equipment

Inverted Epi and Diascopic Optical Microscope

Confocal/Multiphoton Fluorescence Microscopy

Responsible: Ermelinda Maçoas

Contact

Tel.: 218 419 206

e-mail: ermelinda.macoas@tecnico.ulisboa.pt

Access Conditions

Contact the responsible. Within collaborative research work

Further Information

http://cqfm.ist.utl.pt/Resources_list.html#Microscopy

http://cqfm.ist.utl.pt/Services.html

Location

Instituto Superior Técnico, Avenida Rovisco Pais, Lisboa, CQFM - Molecular Physic and Chemistry Centre, Interdisciplinary Complex, room 532A

Applications

Imaging (2D and 3D) with simultaneous detection of three different emission zones

Förster Resonant Energy Transfer imaging (FRET)

Fluorescence Recovery After Photobleaching (FRAP)

Fluorescence Loss in Photobleaching (FLIP)

Fluorescence Correlation Spectroscopy (FCS)

Fluorescence Lifetime Imaging (FLIM)

Multiphoton/Confocal Fluorescence Microscope Leica TCS-SP5 Equipment CW-Argon Lasers (458, 465, 488, 496 and 514 nm) HeNe (633nm) Pulsed Lasers: Ti:Saphire (710-990 nm, 100 fs, 80 MHz) Autocorrelator Two APDs set for single molecule FCS TCSPC module coupled to a DCC-100 PMT for FLIM

INESC

Responsible: João Pedro Conde

Contact

Tel.: 213 100 237

Fax: 213 145 843

e-mail: geral@inesc-mn.pt

Access Conditions

Contact the responsible. Within collaborative research work.

Scanning Electron Microscope

Hitachi S2500

Equipment

Standard low voltage (3-30 kV) scanning electron microscope

Tungsten hairpin type filament

Magnification: 20 - 100 000x

Resolution: 3.5 nm

Maximum beam current: 300 mA maximum

Location

Rua Alves Redol, Nº9, PDMS room

Optical Microscope (1)

Olympus CKX41

Equipment

Reflected light IC inspection microscope

Magnifications: 100x, 500x and 1000x

Dark field and Nomarsky DIC (Differential Interference Contrast) observation capabilities

Location

Rua Alves Redol, Nº9

Optical Microscope (2)

Leica DMLM

Location

Rua Alves Redol, Nº9