Citações de Artigos em Revistas Internacionais

 

ARR.1

F. Corrêa Alegria e A. Cruz Serra,

"Automatic Calibration of Analog and Digital Measuring Instruments Using Computer Vision",

IEEE Transactions on Instrumentation and Measurement, vol. 49, nº 1, pp. 94-99, Fevereiro de 2000.

Fevereiro de 2000

 

1

Esteban Vázquez-Fernández, Angel Dacal-Nieto, Higinio González-Jorge, Fernando Martín, Arno Formella  and Victor Alvarez-Valado

"A machine vision system for the calibration of digital thermometers"

Measurement Science and Technology, vol. 20, no. 6, June 2009, paper 65106.

2

G. Andria, G. Cavone, L. Fabbiano, N. Giaquinto and M. Savino

"Automatic Calibration System for Digital Instruments Without Built-In Communication Interface"

XIX IMEKO World Congress, September 6−11, 2009, Lisbon, Portugal, pp. 857-860.

3

Wen He , Teng Zhaosheng,  Yang Shengjie, Liu Shurong

"Intelligent reading method for analog meter based on computer vision"

Chinese Journal of Scientific Instrument, vol. 28, no. 7, 2007.

4

Ele Zhijie, Zhang Bin

"Automatic meter reading accuracy pointer Recognition"

Computer Aided Engineering, vol 15, no. 3, 2006, pp. 9-12.

5

Lisheng Yang, Ye Wu, Sui-Li Feng, Wang Wei

"DSP-based instrument monitoring system"

TV Technology, vol. 10, 2004, pp. 89-91.

6

Zhao Yanqin,

"Automatic Interpretation Method for an Analog instrument based on computer vision technology"

Electricity Information, no. 3, 2001, pp. 39-42.

7

O. Costea, C. Donciu

"LabVIEW Based Analog and Digital Instrument's Automated Calibration"

6 th Int. Conf. on the Management of Technological Changes, Alexandroupolis, Greece,September  03-05, 2009, pp. 473-476.

8

A. Carullo, A. Luoni, A. Neri

 "Quality Management Issues for PC-Controlled Calibration Systems"

26 th IEEE International Instrumentation and Measurement Technology Conference, Singapore , May 05-07, pp. 1563.

9

X. F: Zhang, Y. Liu, B. Wan

"An Automatic Measuring Research on Voltmeter with a Cylindrical Panel"

International Conference on Information Technology for Manufacturing Systems, Macau, January 30-31, 2010, pp. 594-598.

 

ARR.2

  F. Corrêa Alegria e A. Cruz Serra,

"Computer Vision Applied to the Automatic Calibration of Measuring Instruments",

Measurement, Elsevier Science, vol. 28, nº 3, pp. 185-195, Outubro de 2000.

Outubro de 2000

 

1

Yusuke Fujita and Yoshihiko Hamamoto

 "Automatic Reading of an Analogue Meter Using Image Processing Techniques"

IEEJ Transactions on Electronics, Information and Systems, vol. 129, no. 5, May 2009, pp. 901-908.

 

ARR.3

F. Corrêa Alegria e A. Cruz Serra,

"Influence of Frequency Errors in the Variance of the Cumulative Histogram",

IEEE Transactions on Instrumentation and Measurements, vol. 50, n.º 2, pp. 461-464, Abril de 2001.

Abril de 2001

 

1

R. S. Gamad and D. K. Mishra

"Gain error, offset error and ENOB estimation of an A/D converter using histogram technique"

Measurement, Volume 42, Issue 4, May 2009, Pages 570-576.

2

R.S. Gamad, D.K. Mishra ,

"Comparative Evaluation of Dynamic Testing of A/D Converter using Histogram Technique"

Research Journal of Institute of Engineers (IE)-ET, India, Volume 90, January 2010, pp. 17-21.

 

ARR.4

F. Corrêa Alegria, Pasquale Arpaia, Pasquale Daponte e A. Cruz Serra,

"An ADC Histogram Test Based on Small-Amplitude Waves",

Measurement, Elsevier Science, vol. 31, nº 4, pp. 271-279, Junho de 2002. (2 citações)

Junho de 2002

 

1

Linus Michaeli, Peter Michalko, Jan Saliga,

"Unified ADC nonlinearity error model for SAR ADC",

Measurement, Vol. 41,no. 2, February 2008, pp. 198-204.

2

L. Satish, Santosh C. Vora, Alok Kumar Sinha,

"A time efficient method for determination of static non-linearities of high-speed high-resolution ADCs, "

Measurement, Volume 38, Issue 2, September 2005, Pages 77-88.

3

Linus Michaeli, Peter Michalko, Jan Saliga,

"A new ADC fast testing method based on the unified error model",

Measurement, Vol. 41, no. 2, February 2008, pp. 192-197.

4

Martin Emmenegger, Felix Jenni, René Künzi, Hans Jaeckle, Steffen Schnabel

"Analysis and Calibration of a High Precision AD Converter"

12 th European Conference on Power Electronics and Applications, 2 - 5 September 2007, Aalborg, Denmark.

5

Vora, S.C., Satish, L. ,

 "A Proposal for Concurrent Estimation of Static and Dynamic Nonlinearity of ADC,"

Power Delivery, IEEE Transactions on , vol.24, no.2, pp.524-530, April 2009.

6

S. C. Vora, L. Satish,

"ADC Static Characterization Using Nonlinear Ramp Signal"

IEEE Transactions on  Instrumentation and Measurement, vol. PP, no. 99, 2009.

 

ARR.5

F. Corrêa Alegria, Pasquale Arpaia, A. Cruz Serra e Pasquale Daponte,

"Performance Analysis of an ADC Histogram Test Using Small Triangular Waves",

IEEE Transactions on Instrumentation and Measurements, vol. 51, nº 4, pp. 723-729, Agosto de 2002. (8 citações)

Agosto de 2002

 

1

Attilio Di Nisio, Nicola Giaquinto, Laura Fabbiano, Giuseppe Cavone, Mario Savino

 "Improved Static Testing of A/D Converters for DC Measurements"

IEEE Transactions on Instrumentation and Measurement, vol. 58, no. 2, pp. 356-364, 2009.

2

Attilio Di Nisio, Giuseppe Cavone, Nicola Giaquinto, Laura Fabbiano, Mario Savino

 "Improved Static Testing of A/D Converters for DC Measurements"

IEEE Instrumentation & Measurement Technology Conference, Warsaw, Poland, May 1-3 , pp. 1461-1465, 2007.

3

Attilio Di Nisio, Laura Fabbiano, Nicola Giaquinto, Mario Savino

"Statistical properties of an ML estimator for static ADC testing"

12 th Workshop on ADC Modelling and Testing, Iasi, Romania, 19 - 20 Sept 2007.

4

L. Svilainis, V. Dumbrava

"Measurement of complex impedance of ultrasonic transducers"

ULTRAGARSAS Journal, vol. 66, no. 1, 2007, pp. 26-29.

5

Giuseppe Cavone , Attilio Di Nisio, Nicola Giaquinto, Mario Savino

"A Maximum Likelihood Estimator for ADC and DAC Linearity Testing"

13 th Workshop on ADC Modelling and Testing Sep. 22-24, 2008, Florence, Italy.

6

Shalabh Goyal and Abhijit Chatterjee

"Linearity Testing of A/D Converters Using Selective Code Measurement"

Journal of Electronic Testing, vol. 24, no. 6, December 2008, pp. 567-576.

7

Linus Michaelia, Ján Šaligaa, Peter Michalkob,

"Triangular testing signal for identification of unified error model parameters"

Measurement, vol. 40, no. 5, June 2007, pp. 491-499.

8

Goyal, S.  Chatterjee, A.   Atia, M.   Iglehart, H.   Chung Yu Chen   Shenouda, B.   Khouzam, N.   Haggag, H.

 "Test time reduction of successive approximation register A/D converter by selective code measurement"

IEEE international Test Conference, 8 November, 2005, pp. 218-225.

9

Attilio Di Nisio, Nicola Giaquinto, Mario Savino ,

"Loop-back linearity test of ADCs and DACs"

IEEE Instrumentation and Measurement Technology Conference, Singapura, 5-7 May, 2009, pp. 852-855.

10

Attilio Di Nisio, Laura Fabbiano, Nicola Giaquinto, Mario Savino

Maximum likelihood estimation for linearity testing of ADCs stimulated by known constant signals

Computer Standards & Interfaces, vol. 32, no. 3, March 2010, pp. 119-125.

11

David Slepička

"Easy Estimation of Spectral Purity of Test Signals for ADC Testing"

13 th Workshop on ADC Modelling and Testing, Sep. 22-24, 2008, Florence, Italy.

12

R. S. Gamad and D. K. Mishra

"Determination of error in nonlinearity estimation in an A/D converter with triangular wave input"

International Journal of Electronics 96.12 (2009). 25 May. 2010.

13

S. C. Vora, L. Satish,

"ADC Static Characterization Using Nonlinear Ramp Signal"

IEEE Transactions on  Instrumentation and Measurement, vol. PP, no. 99, 2009.

 

ARR.6

F. Corrêa Alegria e A. Cruz Serra,

"Variance of the Cumulative Histogram of ADCs due to Frequency Errors",

IEEE Transactions on Instrumentation and Measurements, vol. 52, nº 1, pp. 69-74, Fevereiro de 2003.

Fevereiro de 2003

 

1

Dominique Dallet (ed.), José Machado da Silva (ed.),

"Dynamic characterisation of analogue-to-digital converters",

Springer, November 2005.

2

Jerome J. Blair,

"Selecting test frequencies for sinewave tests of ADCs"

IEEE Transactions on  Instrumentation and Measurement, vol. 54, no. 1, 2005, pp. 73-78.

3

H. Ting, B. Liu, S.  Chang,

"A Histogram-Based Testing Method for Estimating A/D Converter Performance"

IEEE Transactions on Instrumentation and Measurements, vol. 57, nº 2, pp. 420-427, 2008.

4

R.S. Gamad, D.K. Mishra ,

"Comparative Evaluation of Dynamic Testing of A/D Converter using Histogram Technique"

Research Journal of Institute of Engineers (IE)-ET, India, Volume 90, January 2010, pp. 17-21.

 

ARR.7

A. Cruz Serra, F. Corrêa Alegria, R. Martins e M. Fonseca da Silva,

"Analog to Digital Converters Testing - New Proposals",

Computer Standards & Interfaces, vol. 26/1, pp. 3-13, Janeiro de 2004. (6 citações)

Janeiro de 2004

 

1

L. Satish, Santosh C. Vora, Alok Kumar Sinha,

"A time efficient method for determination of static non-linearities of high-speed high-resolution ADCs, "

Measurement, Volume 38, Issue 2, September 2005, Pages 77-88.

2

Kui-Fu Chen,

"On the condition of four-parameter sine wave fitting,"

 Computer Standards & Interfaces, Volume 29, Issue 2, February 2007, Pages 174-183.

3

Kui-Fu Chen, Yi-Ming Xue,

"Improving four-parameter sine wave fitting by normalization,"

Computer Standards & Interfaces, Volume 29, Issue 2, February 2007, Pages 184-190.

4

Vora, S.C., Satish, L. ,

 "A Proposal for Concurrent Estimation of Static and Dynamic Nonlinearity of ADC,"

Power Delivery, IEEE Transactions on , vol.24, no.2, pp.524-530, April 2009.

5

De Vito, L.; Rapuano, S.; Slepieka, D.; ,

"ADC standard harmonization: Comparison of test methods - Phase II,"

Instrumentation and Measurement Technology Conference, 2009. I2MTC '09. IEEE , vol., no., pp.1490-1495, 5-7 May 2009.

6

Cleonilson Protásio de Souza, Cláudio Leão Torres, Raimundo C. S. Freire, Francisco M. de Assis

 "ADC Functional Testing Using Artificial Immune System"

19th IMEKO World Congress, September 6-11, 2009 Lisbon, Portugal, pp.  698-701,   September 2009.

 

ARR.9

F. Corrêa Alegria e A. Cruz Serra,

"Error in the Estimation of Transition Voltages with the Standard Histogram Test of ADCs",

Measurement, Elsevier Science, vol. 35, nº 4, pp. 389-397, Junho de 2004.

Junho de 2004

 

1

R. S. Gamad and D. K. Mishra

"Estimation of Error in Nonlinearity in ADC using Standard Histogram Technique"

Proceedings of the World Congress on Engineering and Computer Science 2008, , San Francisco, USA, October 22 - 24, 2008.

2

R. S. Gamad and D. K. Mishra

"Determination of error in nonlinearity estimation in an A/D converter with triangular wave input"

International Journal of Electronics 96.12 (2009). 25 May. 2010.

3

R. S. Gamad and D. K. Mishra

"Effects of Overdrive, Frequency, Sample and Error in Code Transition levels on Computation of ENOB of an A/D Converter"

International Journal of Electronic Engineering Research ISSN 0975 - 6450 Volume 1 Number 4 (2009) pp. 3357-3365.

4

R. S. Gamad and D. K. Mishra

"Gain error, offset error and ENOB estimation of an A/D converter using histogram technique"

Measurement, Volume 42, Issue 4, May 2009, Pages 570-576.

 

ARR.10

F. Corrêa Alegria, P. Girão, V. Haasz, A. Cruz Serra,

"Performance of Data Acquisition Systems from the User's Point of View",

IEEE Transactions on Instrumentation and Measurement, vol. 53, nº 4, pp. 907-914, Agosto de 2004.

Agosto de 2004

 

1

Mihai V. Micea, Vladimir-Ioan Cretu, Voicu Groza

"Maximum predictability in signal interactions with HARETICK kernel"

IEEE Transactions on Instrumentation And Measurement , vol. 55, no. 4, pp. 1317-1330, Agosto 2006.

2

Nicola Locci, Carlo Muscas, Sara Sulis

"Modeling ADC Nonlinearity in Monte Carlo Procedures for Uncertainty Estimation"

IMTC 2004 - Instrumentation and Measurement Technology Conference, Como, Italy. 18-20 May 2004, pp. 522-527.

3

David W. Braudaway

"Uncertainty Specification for Data Acquisition (DAQ) Devices"

IEEE Transactions on Instrumentation and Measurement, vol. 55, no. 1, February 2006, pp. 74-78.

4

Jerzy Hoja, Grzegorz Lentka

"Ograniczenia wirtualnego miernika impedancji opartego na karcie akwizycji danych"

Kongres Metrologii 2007, 9 - 13 Setembro, Kraków, Polónia, 2007.

 

ARR.11

F. Corrêa Alegria, A. Cruz Serra,

"Uncertainty of ADC Random Noise Estimates Obtained With the IEEE 1057 Standard Test",

IEEE Transactions on Instrumentation and Measurement, vol. 54. nº 1, pp. 110-116, Fevereiro de 2005.

Fevereiro de 2005

 

1

Dusan Agrez

"Analysis of the Residual Spectrum in ADC Dynamic Testing"

IEEE Transactions on Instrumentation and Measurement, vol. 58, no. 3,pp. 506-511, Março de 2009.

2

Dusan Agrez,

"Analysis of the residual spectrum in ADC dynamic testing,"

IEEE IMTC, Sorrento, Italy, 24-27 April 2006, pp. 1033-1037.

 

ARR.13

F. Corrêa Alegria e A. Cruz Serra,

"Overdrive in the Ramp Histogram Test of ADCs",

IEEE Transactions on Instrumentation and Measurement, vol. 54. nº 6, pp. 2305-2309, Dezembro de 2005.

Dezembro de 2005

 

1

R.S. Gamad, D.K. Mishra,

"Gain error, offset error and ENOB estimation of an A/D converter using histogram technique",

Measurement, Volume 42, Issue 4, May 2009, Pages 570-576.

2

R.S. Gamad, D.K. Mishra ,

"Comparative Evaluation of Dynamic Testing of A/D Converter using Histogram Technique"

Research Journal of Institute of Engineers (IE)-ET, India, Volume 90, January 2010, pp. 17-21.

3

Domenico Luca Carnì, Domenico Grimaldi

"State of Art on the Tests for ΣΔ ADC"

12 th Workshop on ADC Modelling and Testing, Iasi, Romania, 19 - 20 Sept 2007.

4

R. S. Gamad and D. K. Mishra

"Determination of error in nonlinearity estimation in an A/D converter with triangular wave input"

International Journal of Electronics 96.12 (2009). 25 May. 2010.

 

ARR.14

F. Corrêa Alegria e A. Cruz Serra,

"ADC Transfer Curve Types - A Review",

Computer Standards & Interfaces, Elsevier, vol. 28, nº 5, pp. 553-559, Junho de 2006.

Junho de 2006

 

1

C. M. Akujuobi, E. Awada

"Wavelet-based ADC testing automation using labview"

International Review of Electrical Engineering, vol. 3, no. 5, September-October 2008, pp. 922-930.

2

Mohammad Deghat, Paknosh Karimaghaee,

"A new method for integrating analog to digital conversion based on error reduction,"

Measurement, Volume 40, Issues 9-10, November-December 2007, Pages 919-927.

 

ARR.15

F. Corrêa Alegria e A. Cruz Serra,

"Standard Histogram Test Precision of ADC Gain and Offset Error Estimation",

IEEE Transactions on Instrumentation and Measurement, vol. 56, nº 5, pp. 1527-1531, Outubro de 2007.

Outubro de 2007

 

1

R.S. Gamad, D.K. Mishra,

"Gain error, offset error and ENOB estimation of an A/D converter using histogram technique",

Measurement, Volume 42, Issue 4, May 2009, Pages 570-576.

2

R. S. Gamad and D. K. Mishra

" Estimation of Error in Nonlinearity in ADC using Standard Histogram Technique "

Proceedings of the World Congress on Engineering and Computer Science 2008 , , San Francisco, USA, October 22 - 24, 2008 .

3

R. S. Gamad and D. K. Mishra

"Determination of error in nonlinearity estimation in an A/D converter with triangular wave input"

International Journal of Electronics 96.12 (2009). 25 May. 2010.

4

R. S. Gamad and D. K. Mishra

"Effects of Overdrive, Frequency, Sample and Error in Code Transition levels on Computation of ENOB of an A/D Converter"

International Journal of Electronic Engineering Research ISSN 0975 - 6450 Volume 1 Number 4 (2009) pp. 3357-3365.

 

ARR.19

F. Corrêa Alegria,

"Bias of Amplitude Estimation Using Three-Parameter Sine Fitting in the Presence of Additive Noise",

Measurement, Elsevier Science, vol. 42, nº 5, pp. 748-756, Junho de 2009.

Junho de 2009

 

1

Peter Handel,

"Amplitude estimation using IEEE-STD-1057 three-parameter sine wave fit: Statistical distribution, bias and variance,"

Measurement, vol. 43, no. 6, July 2010, pp. 766-770.

 

ARR.21

F. Corrêa Alegria, E. Martinho, F. Almeida,

"Measuring Soil Contamination with the Time Domain Induced Polarization Method Using LabVIEW",

Measurement, vol. 42, no. 7, pp.1082-1091, Agosto de 2009

Agosto de 2009

 

1

Hu Meng,  Jiangyuan Li, Yonghuai Tang

"The design and application of virtual ion meter based on LABVIEW 8.0"

Review of Scientific Instruments, vol.  80, no. 084101, 2009.