Bibliografia

Principal

  • Essentials of Electronic Testing for digital, Memory and Mixed-signal VLSI Circuits: Michael L. Bushnell, Vishwani D. Agrawal 2000 Kluwer Academic Publishers
  • Self-Checking and Fault Tolerant Digital Design: Parg K. Lla 2001 Morgan Kaufmann Publishers
  • An Introduction to Reliability and Maintainability Engineering: C. E. Ebeling 1997 McGraw-Hill

Secundária

Não foi definida bibliografia secundária